Shanghai Linpin Instrument Co., Ltd
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Firm Information
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    1580074900313818913497
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    Linpin Industrial Park, No. 888 Zhangong Road, Linhai Industrial Zone, Fengxian District, Shanghai
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Electrical component aging box
Product Usage: The electrical component aging box is used to test the parameters and performance of electrical components after undergoing high-temper
Product details
Equipment model Studio size (D * W * H) mm Dimensions (D * W * H) mm
LRHS-1000-LG 1000×1000×1000 According to the three views of the contract
LRHS-2000-LG 1000×2000×1000
LRHS-4000-LG 2000×2000×1000
LRHS-6000-LG 2000×3000×1000
Technical Parameter
Sales Hotline: 021-608 99999
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temperature range RT+10℃~200℃/RT+10℃~300℃
temperature uniformity ≤ 2 ℃ (when unloaded)
temperature fluctuation ± 0.5 ℃ (when unloaded)
heating rate 1.0~3.0℃/min
Full heating rate throughout the process <50 minutes (RT+10-200 ℃)
Time setting range 1~60000M
Observation window 210 × 275mm or 395 × 395mm (effective field of view)
test hole Installed on the left side of the machine, used for external testing of power or signal lines
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material
material
External material High quality A3 steel plate electrostatic spraying
Inner box material Imported high-grade stainless steel SUS304
Insulation material Rigid polyurethane foam+glass fiber
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temperature controller Imported "Youyi Control" brand temperature instrument
temperature sensor PT100 platinum resistance thermometer
AC contactor Schneider, France
Overtemperature protector South Korea RAINBOW
miniature circuit breaker Schneider, France
Standard configuration Sample Holder
Safety protection Overheating, fan motor overheating, equipment timing
Underphase/reverse phase, leakage protection, overload and short circuit protection of the whole machine
supply voltage AC380V±10% 5Hz
Power 9.5kW 14.0kW 18.5kW 22.0kW
Usage environment 5℃~+28℃ ≤85% RH
Note:
1. The test data were measured under good ventilation conditions at an ambient temperature of 25 ℃
2. The above parameters are for reference only and can be customized according to the specific testing parameters of the user
3. This technical information is subject to change without prior notice

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